Thread: Massive interactivity improvement under high I/O load!
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joerg_rw is offline joerg_rw
2011-02-18 , 12:53
Posts: 2,222 | Thanked: 12,651 times | Joined on Mar 2010 @ SOL 3
#54
Originally Posted by retsaw View Post
... And when you say ruin, do you mean simply corrupt the data on it by not leaving it in a clean state or do you mean electrically damage so it can't be used again?
I mean electrical (or lowest level logical) damage caused by breaking power supply so a erase or flash cycle gets aborted. (possible) Result: card defect, bin it.

/j
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