The Following User Says Thank You to vetsin For This Useful Post: | ||
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2011-10-19
, 00:39
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Posts: 2,222 |
Thanked: 12,651 times |
Joined on Mar 2010
@ SOL 3
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#22
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The Following 2 Users Say Thank You to joerg_rw For This Useful Post: | ||
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2011-10-19
, 10:01
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Posts: 3,074 |
Thanked: 12,960 times |
Joined on Mar 2010
@ Sofia,Bulgaria
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#24
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sorry I have to disagree, for two reasons: first your equation is missing the true nature of the problem which is electromigration and not voltage or power or energy.
And second it's missing SmartReflex(R) set of measures in OMAP, which mostly defeats the only possible purpose of your undervolting which was to reduce current density, the true cause of electromigration. Higher clock rates cause steeper edges in level changes, cause faster charging of parasitary capacitors, cause higher current density surges, cause more electromigration.
Actually SmartReflex function blocks inside OMAP, which are taking care about virtually every single gate and transistor and adjust their individual working points (basically the quiescent current) accordingly to match the clock frequency might even cause your undervolting to result in a worse situation regarding electromigration. I for sure don't know enough of the particular details of what's going on inside the chip's gates to rule it out. If you actually know more... I'm listening.
So no, you're NOT safe.
Please don't first turn my words into their opposite to accuse me being a liar then! :-( What of >>2000h total of actually running at that clock speed (see my prev posters about dynamic clock speed and idle)<< makes you think I told something about CPU being permanently locked at max clockspeed?
Sure the parameters come from TI, as not even Nokia can afford the needed tests or had the mandatory insight in and knowledge about the chip's internals, nor the tools like electron microscopes etc to examine chips suffering EM after test runs. It's however a weird idea to think of those parameters as "optimized for TI eval-boards". And it's silly to think you could optimize those for N900, as it's just the chip and only the chip that's relevant here and that is determining those parameters.
Any design particulars like heat dissipation of N900 are absolutely irrelevant for that, they only where relevant if the main problem of OC was overheating which it definitely is not.
All this shows again why there's so much nonsense around OC, everybody is starting with arbitrary random assumptions (like OC problem was heat) and then gets involved in sophistic developments and theories based on those false assumptions (here e.g. undervolting, maybe even dynamic, based on ambient temperature, eh?)
Sorry if the above maybe sounds a bit harsh, but it really annoys me since almost 2 years now, and all the info has been given over and over and over again, it's all there for everybody to read and understand. But no, OC is cool, and WFM, and of course every EE that tells something different is just a fool, no matter if it's Igor of Nokia, or me, or the guy writing the OMAP3430 datasheet. N900 community is so smart they know best, no doubt.
cheers
jOERG
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2011-10-19
, 12:49
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Posts: 1,427 |
Thanked: 2,077 times |
Joined on Aug 2009
@ Sydney
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#25
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2011-10-19
, 13:12
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Posts: 1,033 |
Thanked: 1,013 times |
Joined on Jan 2010
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#26
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2011-10-19
, 13:43
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Posts: 2,222 |
Thanked: 12,651 times |
Joined on Mar 2010
@ SOL 3
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#27
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The Following 7 Users Say Thank You to joerg_rw For This Useful Post: | ||
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2011-10-19
, 23:30
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Posts: 105 |
Thanked: 4 times |
Joined on Sep 2011
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#28
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2011-10-20
, 00:10
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Posts: 5,028 |
Thanked: 8,613 times |
Joined on Mar 2011
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#29
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The Following User Says Thank You to Estel For This Useful Post: | ||
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2011-10-20
, 07:50
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Posts: 1,033 |
Thanked: 1,013 times |
Joined on Jan 2010
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#30
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The Following User Says Thank You to patlak For This Useful Post: | ||
wow! information overload! i like it! thanks for sharing.